Work

Impact of Hot-Carrier Degradation on Flicker Noise (1/f) in 45-nm PD-SOI Floating-Body NFETs

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10982807

Authors: Shruti Pathak, Aarti Rathi, Abhisek Dixit, P. Srinivasan, Oscar H. Gonzalez

Institutions: Indian Institute of Technology Delhi, GlobalFoundries (United States)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410394347

FWCI:

Cites: 34

Cited by:

Related to: 10