Impact of Gate Metal Work Function on 1/f Noise in RMG MOSFETs
Year: 2025
Type: conference-paper
Authors: R. Asanovski, H. Arimura, J. Ganguly, P. Palestri, A. Grill, B. Kaczer, N. Horiguchi, L. Selmi, J. Franco
Institutions: IMEC, University of Modena and Reggio Emilia
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410394662