Work

AI-Powered Analytics Using Empirical Data from In-Field Measurements and Reliability Qualification

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10983052

Authors: D. Alexandrescu, J. Athavale, L. Kennedy, S. Datta

Institution: Synopsys (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410395014

FWCI: 2.325

Cites: 4

Cited by: 1

Related to: 10