Work

Microprocessor Switching Activity Translation to AC Gate Oxide Wearout: Does it Matter? INTEL4 Meteor Lake Chip Activity Case Study

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10982850

Authors: Luigi Pantisano, K. Joshi, Z. Chbili, E. Frantz, S.M. Ramey, J. Hicks, H. Le, K.M Foley, K. Pasumarthi, J. Sebot

Institution: Intel (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410395186

FWCI: 7.075

Cites: 9

Cited by: 3

Related to: 10