Work

Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10983521

Authors: Simon Van Beek, Adrian Chasin, Subhali Subhechha, Harold Deckers, Nouredine Rassoul, Yiqun Wan, Hongwei Tang, Joao P. Bastos, Attilio Belmonte, Gouri Sankar Kar

Institution: IMEC

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410395237

FWCI:

Cites: 10

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Related to: 10