New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime
Year: 2025
Type: conference-paper
Authors: Weiman Yan, Ernest Wu, Elyse Rosenbaum
Institutions: University of Illinois Urbana-Champaign, IBM (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W4410395338