Work

Analytical Modeling of RTN with Short Dwell Time for Strict Memory Bit Error Estimation

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10983764

Authors: Kazuya Uejima, Kenzo Manabe, Y oshihiro Hayashi

Institution: National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410395368

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Cites: 16

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Related to: 10