Work

Evaluation of High Holding Voltage SCR Protection Capability in EOS and Overvoltage Regimes

Year: 2025

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps48204.2025.10983331

Authors: Vladislav Vashchenko, Andrei Shibkov

Institutions: Analog Devices (United States), Angstrom Designs (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410395372

FWCI:

Cites: 10

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Related to: 10