Residue Amplifier Gain Error Duplication and Cancellation for Two-Step Pipelined ADCs
Year: 2025
Type: conference-paper
Authors: Ziyuan Guo, Sharisse Poff, Jared Marchant, Shiuh-hua Wood Chiang
Institution: Brigham Young University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410428396
