Work

Investigation of nanoscale surface roughness, fractal growth, optical constant and dispersion parameters of rf-sputtered CdS thin films for high-performance metal–semiconductor photodetector

Year: 2025

Type: article

Source: Optical and Quantum Electronics

Authors: Sakshi Pathak, Shristi Chaudhary, Monika Shrivastav, Jiten Yadav, Shivam Shukla, Ştefan Ţălu, Naveen Kumar, Fernando Guzman, Sanjeev Kumar, Chandra Kumar

Institutions: Chandigarh University, Malaviya National Institute of Technology Jaipur, Indian Institute of Technology Kharagpur, Technical University of Cluj-Napoca, Galgotias University, Universidad Católica del Norte, Universidad Mayor

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410471065

FWCI: 1.617

Cites: 59

Cited by: 7

Related to: 10