Work

Measuring the refractive index of materials with very low reflection coefficients at millimeter wavelengths

Year: 2025

Type: article

Source: Optical Engineering

DOI: 10.1117/1.oe.64.5.054108

Authors: Peter R. Smith, James C. Weatherall, Jeffrey Barber

Institution: United States Department of Homeland Security

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410483605

FWCI:

Cites: 34

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Related to: 10