The establishment and application of a new reliability model for EMUs based on failure data
Year: 2025
Type: article
Authors: Haijing Hou, Guojie Cai, Yuhan Tang, Qi Dong, Xiaolei Qian
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410507384