Work

Emerging thermal metrology for ultra-wide bandgap semiconductor devices

Year: 2025

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0256723

Authors: D. Myren, F. Vásquez-Aza, J. S. Lundh, M. J. Tadjer, G. Pavlidis

Institutions: University of Connecticut, United States Naval Research Laboratory

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Defense Science and Engineering Graduate, Office of Naval Research

OpenAlex ID: W4410515867

FWCI: 3.877

Cites: 93

Cited by: 12

Related to: 10