Width-Induced Hump Effect and Electrical Stress Impact on N-Type Junctionless Gate-All-Around Transistors
Year: 2025
Type: article
Authors: Wen-Teng Chang, Hung-Hsi Chen, Ching-Lun Wang, Chun-Ting Kuo, Yueh-Ting Ho, Jen-Chien Li
Institution: National University of Kaohsiung
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G9000187733
OpenAlex ID: W4410536746