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Reliability Simulation and Analysis of a 340 GHz Traveling Wave Tube

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Year: 2025
Type: article
Source: IEEE Transactions on Electron Devices
DOI: 10.1109/ted.2025.3564262
Authors: Xiangpeng Liu, Gongao Xia, Zhihao Jin, Jianwei Zhong, Yunfei Yang, Jinshu Wang
Institutions: Beijing University of Technology, Chinese Academy of Sciences, Aerospace Information Research Institute
Language: English

Topic: Gyrotron and Vacuum Electronics Research
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China
Awards: G2636929496, G3648254740, G55270692
OpenAlex ID: W4410536795
FWCI:
Cites: 25
Cited by:
Related to: 10
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