Work

Fault-Tolerant Design Framework for Probabilistic-Bit (P-Bit) Systems: Proposal and Analysis

Year: 2025

Type: article

Source: IEEE Transactions on Circuits and Systems I Regular Papers

DOI: 10.1109/tcsi.2025.3569769

Authors: Amina Haroon, Sneh Saurabh

Institution: Indraprastha Institute of Information Technology Delhi

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Department of Science and Technology, Philippines

OpenAlex ID: W4410537683

FWCI: 0.227

Cites: 50

Cited by: 1

Related to: 10