Work

Truncated Near-Field Microwave Microscope With High Quality Factor in Wide Frequency Range for Permittivity Measurement

Year: 2025

Type: article

Source: IEEE Microwave and Wireless Technology Letters

DOI: 10.1109/lmwt.2025.3567731

Authors: Chong Gao, Nan Chen, Hui Zhu, Xue Niu, Zhuoyue Zhang, Chengyong Yu, En Li, Yunpeng Zhang, Jiawei Long

Institutions: University of Electronic Science and Technology of China, Sichuan University, West China Medical Center of Sichuan University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G12582379, G1403280904, G6163078684, G8579069997

OpenAlex ID: W4410540210

FWCI: 0.462

Cites: 14

Cited by: 2

Related to: 10