Scattered-Field Testing of Reconfigurable Intelligent Surfaces in a Bistatic Measurement System for Far-to-Far and Far-to-Near Scenarios
Year: 2025
Type: conference-paper
Authors: Chang-Lun Liao, You-Hua Lin, Ike Lin, Chang-Fa Yang
Institution: National Taiwan University of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410553353