Work

Monitoring Metallized Film Capacitor Health: A Method for Estimating Capacitance Amid Short-Term Failures Due to Self-Healing

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3572512

Authors: Yushuang He, Feipeng Wang, Hongming Yang, Archie James Johnston, Xiao Zhang, Jian Li

Institutions: Chongqing University, Changsha University of Science and Technology, Naval University of Engineering

Language: English

Topic: Electromagnetic Launch and Propulsion Technology

Subfield: Aerospace Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Science and Technology Projects of Fujian Province, National Natural Science Foundation of China

Awards: G3879324640, G434804528, G7364527298, G7555017909

OpenAlex ID: W4410613909

FWCI: 1.18

Cites: 33

Cited by: 3

Related to: 10