Work

Analysis of Ring Oscillator Characteristics Induced by Line Edge Roughness Using Convolution Neural Network

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3569513

Authors: Myongjin Kim, Eungyo Jang, Jaehyuk Lim, Changhwan Shin

Institutions: Korea University, Sungkyunkwan University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Research Foundation of Korea

OpenAlex ID: W4410616700

FWCI: 0.451

Cites: 19

Cited by: 2

Related to: 10