Work

Physics-of-Failure based Lifetime Prediction for Power Electronics under Mission Profile Load Conditions

Year: 2025

Type: conference-paper

Source: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

DOI: 10.1109/eurosime65125.2025.11006588

Authors: Jan Albrecht, Tobias Daniel Horn, Leonhard Hertenstein, Sven Rzepka

Institution: Fraunhofer Institute for Electronic Nano Systems

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4410630944

FWCI: 7.075

Cites: 9

Cited by: 3

Related to: 10