Approaches to Mitigate Edge Recombination Effects in Silicon Lifetime Samples With Emitter
Year: 2025
Type: article
Source: IEEE Journal of Photovoltaics
Authors: David Bäurle, Axel Herguth, Giso Hahn
Institution: University of Konstanz
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410638944