Work

Maximizing Interconnect Bandwidth and Efficiency in Nonvolatile Memory, Express-Based Key-Value Solid-State Devices With Fine-Grained Value Transfer

Year: 2025

Type: article

Source: IEEE Micro

DOI: 10.1109/mm.2025.3572475

Authors: Junhyeok Park, Chang-Gyu Lee, Soon Hwang, Seung-Jun Cha, Woosuk Chung, Youngjae Kim

Institutions: Sogang University, Electronics and Telecommunications Research Institute, SK Hynix (South Korea)

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Research Foundation of Korea, Institute for Information and Communications Technology Promotion

Awards: G5901159828, G6056376082, G79798675, G8211887411

OpenAlex ID: W4410639113

FWCI: 0.448

Cites: 6

Cited by: 1

Related to: 10