Work

First-Principles Calculating the Stress Response of $\mathrm{E}_{2}(\text{TO})$ Raman Phonon Deformation Potential in 4H-SiC under Mechanical Loadings

Year: 2025

Type: conference-paper

Source: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

DOI: 10.1109/eurosime65125.2025.11006609

Authors: Zhoudong Yang, Xinyue Wang, Yanyan Zhang, Yuanhui Zuo, Hongyu Tang, Xuejun Fan, Guoqi Zhang, Jiajie Fan

Institutions: Fudan University, Lamar University, Delft University of Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410639450

FWCI:

Cites: 28

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Related to: 10