Sensitivity Analysis of Simulation-Based Lifetime Extrapolation in the Low Temperature Swing Regime for Power Modules Stressed in Power Cycling Tests
Year: 2025
Type: conference-paper
Authors: Nils Zöllner, Sebastian Letz, David Übelacker, Oliver Schilling
Institution: Infineon Technologies (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410639684
