Year: 2025
Type: article
Abstract: Mismatched circuit components in analog-to-digital converters (ADCs) caused by imperfect fabrication processes significantly degrade the ADC performance, and there have been various attempts to address this by carrying out on-chip ADC calibration. However, calibration accuracy suffers from the defects of on-chip circuitry (called design-for-calibration (DfC) circuits) designed to facilitate those calibration processes, which are introduced by variations in the manufacturing process.
Source: IEICE Electronics Express
Authors: Myeonggu Gil, Jaehyun Park, Jacob A. Abraham, Byoungho Kim
Institutions: Hanyang University, The University of Texas at Austin
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4410736234