Work

EMEP: Early-Monitoring Error Prediction for Activity and Variability Resilience in a 28-nm RISC-V Controller

Year: 2025

Type: article

Source: IEEE Journal of Solid-State Circuits

DOI: 10.1109/jssc.2025.3567294

Authors: Clara Nieto Taladriz, Wim Dehaene

Institution: KU Leuven

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410738254

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