A Deep Learning Approach for Fault Detection and Localization in MT-VSC-HVDC System Utilizing Wavelet Scattering Transform
Year: 2025
Type: article
Abstract: This study presents a novel algorithm for automatic fault detection in multi-terminal voltage source converter-based high voltage direct current (MT-VSCHVDC) systems. The approach integrates the wavelet scattering transform (WST) to extract low-variance feature vectors and a newly developed variable batch size long-short-term-memory (VB-LSTM) network for accurate fault detection. The synthetic minority oversampling technique addresses class imbalance issues in fault and no-fault data. Utilizing a 5-fold cross-validation process, the study demonstrates that WST-based features, combined with the proposed VB-LSTM network and a hybrid training strategy, achieve 100% and 99.46% accuracy in classifying internal and external faults with no-noise and 20db noisy conditions respectively. The variable epoch size training enhances convergence speed, leading to more stable and consistent results. A secondary LSTM model with a similar layer architecture is also trained and evaluated on WST-based features to identify the fault location within internal faults. The proposed fault distance (WST-VB-LSTM) estimation model achieves excellent performance with an R-square of 0.9946 and MAE of 0.0135 without noise, and maintains robustness under noise with 30 dB (R² = 0.9903, MAE = 0.0182) and 20 dB (R² = 0.9598, MAE = 0.0364). Lastly, comparative performance analysis reveals that the proposed model outperforms recently published works and state-of-the-art techniques, exhibiting higher accuracy and significantly lower error metrics across varying noise conditions.
Source: IEEE Access
Institutions: Siksha O Anusandhan University, Asian Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,075
OpenAlex ID: W4410770182