Work

Neurosymbolic AI-Driven Zero-Defect Manufacturing in Semiconductor Assembly: A Hybrid Framework

Year: 2025

Type: conference-paper

Source: Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

DOI: 10.1109/asmc64512.2025.11010401

Authors: Mukund Shenoy, Shubhada Sahasrabudhe, Farhad Ameri

Institution: Arizona State University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410771006

FWCI: 7.269

Cites: 6

Cited by: 3

Related to: 10