Work

Event-Based Sampling Architecture and Optimization for Industrial Internet of Things

Year: 2025

Type: conference-paper

Source: Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

DOI: 10.1109/asmc64512.2025.11010320

Authors: Tejas Thosani, Andres Prado Espinoza, Stephanas Lynch, Nick Krumme, Chris Schoeb, Aarathi Vadapalli, Joaquin Avila, Brian Silkey

Institution: Micron (United States)

Language: English

Topic: Digital Transformation in Industry

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410779749

FWCI:

Cites: 1

Cited by:

Related to: 10