Work

Optimizing AI Model Training Costs with Stratified Sampling and Self-Adaptive Testing

Year: 2025

Type: conference-paper

DOI: 10.1109/incacct65424.2025.11011465

Authors: Srihith Chennareddy, Vamshi Krishna Appala

Institution: Microsoft (United States)

Language: English

Topic: Machine Learning and Data Classification

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410809961

FWCI:

Cites: 16

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Related to: 10