Work

Tripping Fault Analysis Caused by Inaccurate Measurement of Optical CT in ±800 kV UHVDC Transmission System

Year: 2025

Type: conference-paper

Source: International Conference on Green Energy and Applications (ICGEA)

DOI: 10.1109/icgea64602.2025.11009939

Authors: Weirong Qian, Pengcheng Sha, Wenbo Li, Junbo Deng, Guanjun Zhang, Yuhang Shi, Dingge Yang

Institutions: State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University

Language: English

Topic: HVDC Systems and Fault Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410810297

FWCI:

Cites: 9

Cited by:

Related to: 10