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Functional and Defect Study in Deep Learning Libraries: A Complex Network Perspective

Year: 2025

Type: article

Source: IEEE Transactions on Reliability

DOI: 10.1109/tr.2025.3567061

Authors: Xuhui Lu, Zheng Zheng, Fangyun Qin, Xiangyue Ma, Qing Cai

Institutions: Beihang University, Capital Normal University

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G1100003544

OpenAlex ID: W4410810541

FWCI:

Cites: 45

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Related to: 10