Work

When to Sample from Feature Diagrams?

Year: 2025

Type: conference-paper

Abstract: Uniform random sampling (URS) has many applications in configurable systems analysis.Usually, feature models consisting of a hierarchical feature diagram and additional side constraints specify the space of valid configurations to be sampled from.However, URS has predominately been applied on feature models translated a priori into conjunctive normal form (CNF).In this work, we study URS approaches that instead operate directly on feature diagrams and provide a comparative evaluation of their performance against well-established URS tools for CNF representations.Our findings suggest that translating feature models to CNF offers advantages, even in the presence of only few side constraints.

Source: International Working Conference on Variability Modelling of Software-Intensive Systems (VaMoS)

DOI: 10.1145/3715340.3715442

Authors: Nikolai Käfer, Sven Apel, Christel Baier, Clemens Dubslaff, Holger Hermanns

Institutions: Technische Universität Dresden, Saarland University, Eindhoven University of Technology

Language: English

Topic: Advanced Software Engineering Methodologies

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: hybrid

Funders: Deutsche Forschungsgemeinschaft, Nederlandse Organisatie voor Wetenschappelijk Onderzoek