Work

NeRF-based defect detection

Year: 2025

Type: conference-paper

Source: International Conference on Remote Sensing, Mapping, and Image Processing (RSMIP)

DOI: 10.1117/12.3067707

Authors: Kirk Ding, Dawei Xiang, Yijiashun Qi, Ze Yang, Zunduo Zhao, Tianyao Sun, Pengbin Feng, Haoyu Wang

Institutions: Baylor University, University of Connecticut, University of Michigan, University of Illinois Urbana-Champaign, New York University, University of Southern California

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410825108

FWCI: 22.73

Cites:

Cited by: 9

Related to: 10