Work

Multilayer target PIXE spectral simulation (X,X) secondary fluorescence correction algorithm

Year: 2025

Type: article

Abstract: The theory for calculation of PIXE secondary fluorescence cross-sections for conversion of primary X-rays in homogeneous and multilayered samples, as a function of the primary emission spot, is presented and used for simulation of PIXE spectra.

Source: Journal of Analytical Atomic Spectrometry

DOI: 10.1039/d4ja00463a

Author: M. A. Reis

Institutions: University of Lisbon, Instituto Superior Técnico, Centro de Ciências e Tecnologias Nucleares

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Funder: Fundação para a Ciência e a Tecnologia

Awards: G295707970, G8465033339