Analysis of Enhanced Degradation Under Dynamic Negative Bias Temperature Instability (NBTI) Condition in Low-Temperature Polycrystalline Silicon Thin-Film Transistors (LTPS TFTs)
Year: 2025
Type: article
Authors: Hong-Yi Tu, Tsung-Ming Tsai, Chuan-Wei Kuo, Yong-Ci Zhang, Ya-Ting Chien, Sheng-Yao Chou, Jui-Chi Hung, Wei-Cheng Tseng
Institution: National Sun Yat-sen University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G730383762
OpenAlex ID: W4410852831