Work

Parity based Error Correction Code for Embedded Memories

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012346

Authors: K Srinidhi, Surya. V. N. S. V. Chakka, M. Vinodhini

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410853307

FWCI: 7.075

Cites: 16

Cited by: 3

Related to: 10