Work

Low and High Frequency Noise Analysis of Si-Ge TFET

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012632

Authors: Pratikhya Raut, K. Jayathi Chowdary, K. Nagendra Siva Kumar, P. Yamini

Institution: Siddhartha Academy of Higher Education

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410853328

FWCI:

Cites: 9

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Related to: 10