Effective Approaches of Deep Learning Models for Automated Fabric Defect Classification
Year: 2024
Type: conference-paper
Authors: Mai N. H. Pham, Thanh M. Vo, Tuan M. Le, Hieu M. Tran, Minh N. T. Nguyen, Son V. T. Dao
Institution: Ho Chi Minh City International University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410853333