Work

Next-Gen Quality Control Using Data-Driven Approaches and Machine Learning in Metal Production

Year: 2025

Type: conference-paper

DOI: 10.1109/icdsaai65575.2025.11011706

Authors: K. Anitha, Mukesh J, Muthuganesh. D, Parvesh. S, Vasu. S

Institution: M. Kumarasamy College of Engineering

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410853607

FWCI:

Cites: 15

Cited by:

Related to: 10