Work

Effect of Interface Trap Charges on Improved Junctionless Nanowire Field Effect Transistor

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012140

Authors: Bharti, Poornima Mittal

Institution: Delhi Technological University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410854075

FWCI:

Cites: 20

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Related to: 10