Work

Investigation Temperature variation on DC and Analog performance of Gate Stack GNRFET using DFT-based atomic scale Modelling

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012213

Authors: Anshul, Rishu Chaujar

Institution: Delhi Technological University

Language: English

Topic: Graphene research and applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Delhi Technological University

OpenAlex ID: W4410854254

FWCI:

Cites: 30

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Related to: 10