Work

Exploring CMOS Technology Impact on Static Random Access Memory (SRAM): A Performance Assessment

Year: 2025

Type: conference-paper

Source: International Conference on Electrical, Computer and Communication Engineering

DOI: 10.1109/ecce64574.2025.11013917

Authors: M. R. Robin, Md. Hasan Maruf, Md. Rashedul Islam Rashed, Md. Shakib Ibne Ashrafi, M.M. Naushad Ali, A S M Shihavuddin

Institutions: Green University of Bangladesh, Presidency University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410854341

FWCI: 16.51

Cites: 17

Cited by: 7

Related to: 10