Work

Development and Testing of a System for Automated Resistance-Voltage Characterization of Programable Optically Variable Resistors

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012297

Authors: Sneha Ray, Rohit Biswas, Kanta Bhattacheryya, Angsuman Sarkar, Palash Das, Aritra Acharyya

Institution: University of Kalyani

Language: English

Topic: Engineering and Technology Innovations

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410854837

FWCI: 2.3

Cites: 3

Cited by: 1

Related to: 10