Work

Comparative Analysis of Dual Metal Gate-Split Source and Bilateral Tunnel Field Effect Transistor

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012210

Authors: Mohammed Hamza, Rahul Goel, Madhulika Verma, Sachin Agrawal

Institution: National Institute of Technology Delhi

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410855154

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Cites: 13

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Related to: 10