Work

Reliability Study of Nano Scale Baugh Wooley Multiplier for Future Digital Signal Processing Applications

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012207

Authors: Janamanchi Rathna Koushal, Md Badhesha, J. Ajayan

Institution: SR University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410855327

FWCI:

Cites: 12

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Related to: 10