Work

Tuning dielectric properties and energy storage of Zr-modified BT-based ferroelectric thin film: effect of annealing temperature

Year: 2025

Type: article

Source: Advances in Natural Sciences Nanoscience and Nanotechnology

DOI: 10.1088/2043-6262/addf2b

Authors: Thu-Hien Vu, Ngoc Minh Nguyen, Tai Nguyen, Van Hieu Dang

Institutions: Trường Đại học Khoa học và Công nghệ Hà Nội, Hanoi University of Science and Technology, Hung Yen University of Technology and Education, Silicon Austria Labs (Austria), FPT University

Language: English

Topic: Ferroelectric and Piezoelectric Materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4410932281

FWCI:

Cites: 40

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Related to: 10