Work

Error analysis and correction of snapshot phase-shift lateral shear interferometer based on dual quality map guided ellipse fitting

Year: 2025

Type: article

Source: Precision Engineering

DOI: 10.1016/j.precisioneng.2025.05.025

Authors: Siqi Wang, Hang Yuan, Ailing Tian, Bingcai Liu, Bingcai Liu, Hongjun Wang, Xueliang Zhu, Jiaming Su, Bei Zhou, Jinyao Hou, Bo Liu, Bo Liu

Institution: Xi'an Technological University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Xi'an Municipal Bureau of Science and Technology, Education Department of Shaanxi Province, Shaanxi Provincial Science and Technology Department, National Defense Basic Scientific Research Program of China

Awards: G5215113167, G7599008962, G866058094, G8834302387

OpenAlex ID: W4410939645

FWCI: 1.422

Cites: 36

Cited by: 4

Related to: 10