Work

A Comprehensive Investigation about Channel Size Effects on PBTI and SILC in Planar High-K MG NFETs

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017958

Authors: Hao Jiang, Sheng Chen, Yueqin Zhu, Jingjing Shi, Feng Zhou

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410986883

FWCI:

Cites: 16

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Related to: 10